In-Sight 1750 Wafer ID and Panel Reader Datasheet | Cognex

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Wafer processing can degrade ID mark quality, making marks hard to read for humans and machine vision alike. The In-Sight 1750 combines enhanced imaging, adaptive reading, and a drop-in upgrade path to keep every wafer traceable. Download the full datasheet for detailed specifications, imaging performance, and compatibility information.

AI Autotune

Automatically adapts to mark variability, helping reduce manual recalibration and keep reads consistent.

Purpose-built multi-mode illumination

Improves contrast across challenging substrates, including Si, GaN, SiC, sapphire, and glass.

Enhanced 2MP imaging and a 38 mm field of view

Provides more detail and coverage for difficult or degraded marks.

Backward Compatible

Matching mounts and form factor with the 1740 series simplify upgrades, and existing jobs convert instead of reconfiguring from scratch.

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